LOG-filter-based inspection of cluster Mura and vertical-band Mura on liquid crystal displays
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SPIE
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Machine-Learning Strategy to Detect Mura Defects in a Low-Contrast Image by Piecewise Gamma Correction;Sensors;2024-02-24
2. Vision-based LCD/OLED defect detection methods：a critical summary;Journal of Image and Graphics;2024
3. Small target detection and window adaptive tracking based on continuous frame images in visible light background;IOP Conference Series: Materials Science and Engineering;2020-01-01
4. An Accurate Mura Defect Vision Inspection Method Using Outlier-Prejudging-Based Image Background Construction and Region-Gradient-Based Level Set;IEEE Transactions on Automation Science and Engineering;2018-10
5. A Review of TFT-LCD Panel Defect Detection Methods;Advanced Materials Research;2013-08-16
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