1. Low-energy electron (0-100 eV) interaction with resists using LEEM,;Thete,2015
2. Dielectric description of wakes and stopping powers in solids
3. Computer simulation of electron transport in solids with applications to materials analysis and characterization,;Dapor,2013
4. Analysis of shot noise limitations due to absorption count in EUV resists,;Bhattarai,2015
5. [Electron Energy-Loss Spectroscopy in the Electron Microscope];Egerton,2011