Description of versatile optical polarimetric scatterometer that measures all 16 elements of the Mueller matrix for reflection and transmission: application to measurements of scatter cross sections, ellipsometric parameters, optical activity, and the complex chiral parameters

Author:

Kubik Robert D.

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference18 articles.

1. M. Born and E. Wolf ,Principles of Optics, 3rd ed., pp. 30–32, 554–555, Pergamon Press, London (1965).

2. W. A. Shurcliff ,Polarized Light, 1st ed., pp. 109–123, Harvard University Press, Cambridge, MA (1966).

3. R. M. A. Azzam and N. M. Bashara ,Ellipsometry and Polarized Light, 1st ed., pp. 173–174, North-Holland, Amsterdam (1977).

4. TMA, TASC Polarimetric Scatterometer, Instrument operation manual, TMA Technologies, Inc. , Bozeman, Montana (1992).

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