Surface Topography Measurements Over The 1 Meter To 10 Micrometer Spatial Period Bandwidth

Author:

Takacs Peter Z.1,Furenlid Karen1,DeBiasse Robert A.1,Church Eugene L.2

Affiliation:

1. Brookhaven National Laboratory (United States)

2. USA ARDEC (United States)

Publisher

SPIE

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3. Simulation and measurement of systematic errors of stitching interferometry for high precision X-ray mirrors with large radius of curvature;Applied Optics;2021-09-23

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