Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods-Reference-Cited by-同舟云学术

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Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods

Published:1999-09-06 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Kozhevnikov Igor V.¹,Asadchikov Victor E.²,Duparre Angela³,Gilev Oleg N.⁴,Havronin Nikolai A.⁴,Krivonosov Yury S.²,Ostashev Vladimir I.⁴,Steinert Joerg⁵

Affiliation:

1. P.N. Lebedev Physical Institute (Russia)

2. Institute of Crystallography (Russia)

3. Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)

4. Russian Federal Nuclear Ctr. (Russia)

5. Technical Univ. of Ilmenau (Germany)

Publisher

SPIE

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. Application of X-ray scattering technique to the study of supersmooth surfaces;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2004-09

5. X-ray investigations of surface roughnesses;Crystallography Reports;2003-09

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