Dielectric constant measurement of thin films by differential time-domain spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.126587
Reference5 articles.
1. A reliable method for extraction of material parameters in terahertz time-domain spectroscopy
2. Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors
3. Time-domain dielectric constant measurement of thin film in GHz–THz frequency range near the Brewster angle
4. Terahertz imaging via electrooptic effect
5. Free-space electro-optic sampling with a high-repetition-rate regenerative amplified laser
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