LATTICE DISORDER PRODUCED IN Si BY 40‐keV BORON AND ITS EFFECT ON ELECTRICAL BEHAVIOR

Author:

Hart R. R.,Marsh O. J.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 36 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Residual defects in low-dose arsenic-implanted silicon after high-temperature annealing;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-02

2. Rapid thermal process-induced defects in silicon position detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1994-01

3. Temperature Dependence of Damage in Boron-Implanted Silicon;MRS Proceedings;1989

4. Annealing of boron-implanted silicon using a CW CO2 Laser;Physica Status Solidi (a);1981-02-16

5. Flux, fluence and implantation temperature dependence of disorder produced by 40 keV N+ion irradiation of GaAs;Radiation Effects;1980-01

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