An x‐ray diffraction study on the microstructure of vapor‐deposited fcc lead films: normal and oblique incidences
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.325764
Reference22 articles.
1. An x-ray line shift analysis in vacuum-evaporated silver films
2. An X-Ray Line Broadening Analysis in the Vacuum-Evaporated Silver Films
3. An X-ray line profile analysis in vacuum-evaporated silver films
4. An X-ray diffraction profile analysis of vacuum-evaporated copper films: normal and oblique vapour incidence
5. An X-ray diffraction profile study in silver films vapour-deposited on a rotating substrate with the axial centre at 44 degrees to the vapour direction
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1. Morphology of thin lead films grown on glass substrates by atomic force and electron microscopy;Materials Chemistry and Physics;2001-08
2. An X-ray profile analysis on the growth imperfections and internal strains in vapour-deposited lead films;Zeitschrift für Kristallographie - Crystalline Materials;2000-11-01
3. Phonon emission spectra of superconducting tunnel junctions;Zeitschrift f�r Physik B Condensed Matter;1986-03
4. Dislocations and stacking faults in Ag-Sn and Cu-Al alloy films;Journal of Materials Science Letters;1985-05
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