A high resolution scanning electron microscope forin situinvestigation of swift heavy ion induced modification of solid surfaces

Author:

Amirthapandian S.,Schuchart F.,Bolse W.

Publisher

AIP Publishing

Subject

Instrumentation

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. The Development of Microscopic Imaging Technology and its Application in Micro- and Nanotechnology;Frontiers in Chemistry;2022-07-05

2. Swift heavy ion shaping of oxide-structures at (sub)-micrometer scales;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-11

3. Alternative uses of a megavolt tandem accelerator for few-keV studies with ion-source SIMS monitoring;Review of Scientific Instruments;2016-06

4. A new setup for the investigation of swift heavy ion induced particle emission and surface modifications;Review of Scientific Instruments;2016-01

5. In-situ high temperature irradiation setup for temperature dependent structural studies of materials under swift heavy ion irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-01

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