A novel technique for studying electric field effect of carrier emission from a deep level center
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.94081
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1. Recombination-Generation and Optical Properties of Gold Acceptor in Silicon
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3. Electric field effect on the thermal emission of traps in semiconductor junctions
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