Laue x-ray diffraction from heterostructures: CdF2–CaF2 superlattices on Si(111)
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.118617
Reference9 articles.
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3. Depth‐resolved measurement of lattice relaxation in Ga1−xInxAs/GaAs strained layer superlattices by means of grazing‐incidence x‐ray diffraction
4. Evaluation of In1−xGaxAs/In1−yGayAs strained layer superlattice structures by x‐ray diffraction measurements with a novel discrimination method of the fundamental peak
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2. Investigation of the structure and luminescence properties of CdF2-CaF2 : Eu superlattices on Si(111);Physics of the Solid State;2013-07
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