Temperature measurements of heated microcantilevers using scanning thermoreflectance microscopy
Author:
Funder
National Science Foundation
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4797621
Reference35 articles.
1. Electrical, Thermal, and Mechanical Characterization of Silicon Microcantilever Heaters
2. Thermal writing using a heated atomic force microscope tip
3. Nanoscale deposition of solid inks via thermal dip pen nanolithography
4. Direct deposition of continuous metal nanostructures by thermal dip-pen nanolithography
5. Room-temperature chemical vapor deposition and mass detection on a heated atomic force microscope cantilever
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1. Local Heating and Simultaneous Temperature Measurement of Single Crystal Silicon Using Two Lasers with Different Wavelengths;Transactions of the Korean Society of Mechanical Engineers - B;2024-08-31
2. Measuring the surface temperature of light-emitting diodes by thermoreflectance;Japanese Journal of Applied Physics;2021-05-01
3. Increasing the speed of frequency-domain, homodyne thermoreflectance imaging;Review of Scientific Instruments;2020-04-01
4. Sub-Beam Size Temperature Measurement of Heavily Doped Silicon Heater Using Two-Wavelength Thermoreflectance Microscopy;Journal of Heat Transfer;2017-02-07
5. Electrothermal Characterization of Doped-Si Heated Microcantilevers Under Periodic Heating Operation;Journal of Heat Transfer;2016-02-09
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