An ultrasoft x‐ray fluorescence detector for EXAFS measurements on low‐Zelements
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1142282
Reference21 articles.
1. Extended-x-ray-absorption-fine-structure studies of low-Zatoms in solids and on surfaces: Studies ofSi3N4, SiO2, and oxygen on Si(111)
2. EXAFS and surface‐EXAFS studies in the soft x‐ray region using electron yield spectroscopy
3. Surface extended-x-ray-absorption-fine-structure study of oxygen interaction with Al(111) surfaces
4. Structure ofp(2×2)andc(2×2)Oxygen on Ni(100): A Surface Extended-X-Ray Absorption Fine-Structure Study
5. Surface Extended X-Ray-Absorption Fine Structure of Low-ZAdsorbates Studied with Fluorescence Detection
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1. Synchrotron Radiation;digital Encyclopedia of Applied Physics;2003-04-15
2. Catalytically Active Oxygen Species in La1-xSrxCoO3-δ Studied by XPS and XAFS Spectroscopy;The Journal of Physical Chemistry B;2000-07-15
3. Development of Gas Scintillation Proportional Counter;International Journal of PIXE;1999-01
4. Application of multiple coatings to protect polyimide-based X-ray windows from eroding oxygen attack;Thin Solid Films;1994-03
5. X‐ray fluorescence measurements of x‐ray absorption near edge structure at the Si, P, and S L edges;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1993-09
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