Extended-x-ray-absorption-fine-structure studies of low-Zatoms in solids and on surfaces: Studies ofSi3N4, SiO2, and oxygen on Si(111)
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.20.664/fulltext
Reference84 articles.
1. New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure
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3. The Structure of Amorphous Solids by X-Ray and Neutron Diffraction
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