Wide range doping controllability of p-type GaN films prepared via pulsed sputtering
Author:
Affiliation:
1. Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
2. ACCEL, Japan Science and Technology Agency (JST), 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan
Funder
Accelerated Innovation Research Initiative Turning Top Science and Ideas into High-Impact Values
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5079673
Reference25 articles.
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3. Present Status and Future Prospect of Widegap Semiconductor High-Power Devices
4. Growth of High Crystalline Quality HVPE-GaN Crystals with Controlled Electrical Properties
5. H. Ishida , R. Kajitani , Y. Kinoshita , H. Umeda , S. Ujita , M. Ogawa , K. Tanaka , T. Morita , S. Tamura , M. Ishida , and T. Ueda , in International Electron Devices Meeting (IEEE, 2016), pp. 20.4.1–20.4.4.
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