Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions-Reference-Cited by-同舟云学术

Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

Published:2018-07-21 Issue:3 Volume:124 Page:035107
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Delmotte Franck¹²,Meyer-Ilse Julia²,Salmassi Farhad²,Soufli Regina¹³,Burcklen Catherine³,Rebellato Jennifer¹,Jérome Arnaud¹,Vickridge Ian⁴^ORCID,Briand Emrick⁴,Gullikson Eric²

Affiliation:

1. Laboratoire Charles Fabry, Institut d'Optique Graduate School, CNRS, Universite Paris-Saclay, 91127 Palaiseau Cedex, France

2. Center for X-ray Optics, Lawrence Berkeley National Laboratory, 2-400 Berkeley, California 94720, USA

3. Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550, USA

4. Institut des NanoSciences de Paris, 4 place Jussieu, F-75252 Paris Cedex 05, France

Funder

European Cooperation in Science and Technology

Université Paris-Saclay

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5027488

Reference39 articles.

1. Cr/Sc multilayers for the soft-x-ray range

2. High-reflectivity Cr∕Sc multilayer condenser for compact soft x-ray microscopy

3. Aperiodic CrSc multilayer mirrors for attosecond water window pulses

4. Phase measurement of soft x-ray multilayer mirrors

5. Thermal stability studies of short period Sc/Cr and Sc/B4C/Cr multilayers

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