The origin of 0.78 eV line of the dislocation related luminescence in silicon
Author:
Funder
National Natural Science Foundation of China
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4754825
Reference20 articles.
1. Dislocation-related photoluminescence in silicon
2. On the nature of the dislocation luminescence in silicon
3. Dislocation structure and photoluminescence of partially relaxed SiGe layers on Si(001) substrates
4. Time-resolved measurements of dislocation-related photoluminescence bands in silicon
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2. Manufacturing metrology for c-Si photovoltaic module reliability and durability, Part I: Feedstock, crystallization and wafering;Renewable and Sustainable Energy Reviews;2016-06
3. Room-Temperature Near-Infrared Electroluminescence from Boron-Diffused Silicon Pn-Junction Diodes;Frontiers in Materials;2015-02-23
4. Determination of the Boron and Phosphorus Ionization Energies in Compensated Silicon by Temperature-Dependent Luminescence;Silicon;2014-05-14
5. Enhancement of room temperature dislocation-related photoluminescence of electron irradiated silicon;Journal of Applied Physics;2013-01-21
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