Author:
Mathieu H. J.,McClure D. E.,Muller R. H.
Cited by
56 articles.
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1. Ellipsometry;Characterization of Materials;2012-05-18
2. The intertwined history of polarimetry and ellipsometry;Thin Solid Films;2011-02
3. Automatic null ellipsometry with an interferometer;Applied Optics;2009-11-05
4. Laser-ellipsometric monitoring of corrosive attack;Protection of Metals and Physical Chemistry of Surfaces;2009-07
5. Advanced nanometer-size structures;Acta Physica Slovaca. Reviews and Tutorials;2007-12-01