Current–voltage characteristics of metal-insulator-semiconductor structures via quantum mechanical tunneling
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.121270
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1. Effects of additive elements on electrical properties of tantalum oxide films
2. Conduction mechanisms in sputtered Ta2O5on Si with an interfacial SiO2layer
3. Some properties of crystallized tantalum pentoxide thin films on silicon
4. Electrical properties of Ta–Sn–O films on indium tin oxide electrodes
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