Performance of an energy-compensated three-dimensional atom probe
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1148477
Reference19 articles.
1. The Atom‐Probe Field Ion Microscope
2. Application of a position‐sensitive detector to atom probe microanalysis
3. The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale
4. Concepts in atom probe designs
5. Improvements in three-dimensional atom probe design
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