Remote electron beam induced current imaging of electrically active regions in YBa2Cu3O7−x single crystals
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.120419
Reference17 articles.
1. Spatial variation of the critical current density of the highTcsuperconducting thin films
2. Low temperature scanning electron microscopy of superconducting thin films and Josephson junctions
3. Cathodoluminescence and microRaman analysis of oxygen loss in electron irradiated YBa2Cu3O7−x
4. Influence of oxygen content on the cathodoluminescence of YBa2Cu3O7−x
5. Cathodoluminescence microscopy of superconducting and non-superconducting Tl2Ba2CuO6+δ polycrystals
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1. Direct Characterization of Grain-Boundary Electrical Activity in Doped (Ba0.6Sr0.4)TiO3by Combined Imaging of Electron-Beam-Induced Current and Electron-Backscattered Diffraction;Journal of the American Ceramic Society;2004-06
2. Study of growth hillocks in GaN:Si films by electron beam induced current imaging;Journal of Applied Physics;2001-07-15
3. Current imaging tunneling spectroscopy characterization of YBa2Cu3O7−x and Bi2Sr2CaCu2O8+x single crystals;Physica C: Superconductivity;2000-07
4. Terahertz radiation imaging of supercurrent distribution in vortex-penetrated YBa2Cu3O7−δ thin film strips;Journal of Applied Physics;2000-05-15
5. Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope;Journal of Applied Physics;1999-08-15
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