Direct Characterization of Grain-Boundary Electrical Activity in Doped (Ba0.6Sr0.4)TiO3by Combined Imaging of Electron-Beam-Induced Current and Electron-Backscattered Diffraction-Reference-Cited by-同舟云学术

Direct Characterization of Grain-Boundary Electrical Activity in Doped (Ba0.6Sr0.4)TiO3by Combined Imaging of Electron-Beam-Induced Current and Electron-Backscattered Diffraction

Published:2004-06 Issue:6 Volume:87 Page:1153-1156
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:

Author:

Hayashi Katsuro,Yamamoto Takahisa,Ikuhara Yuichi,Sakuma Taketo

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.2004.01153.x/fullpdf

Reference24 articles.

1. Thermal Annealing Effects on Grain Boundary Recombination Activity in Slicon;Barhdadi;Appl. Phys. A: Solids Surf.,1989

2. Influence of Dislocation Density on Recombination at Grain Boundaries in Multycrystalline Silicon;Seifert;Semicond. Sci. Technol.,1993

3. On the Electrical Activity of First- and Second-Order Twin Boundaries in Silicon;Cavalcoli;Semicond. Sci. Technol.,1995

4. Relationship between Electrical Activity and Grain Boundary Structural Configuration in Polycrystalline Silicon;Wang;Interface Sci.,1999

5. The Relationship between Crystal Misorientation and Conductive Mode Contrast of Grain Boundaries in Additive-Free Zinc Oxide;Russell;J. Mater. Sci.,1997

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning transmission electron microscope mapping of electronic transport in polycrystalline BaTiO3 ceramic capacitors;Applied Physics Letters;2019-09-23

2. Calculation of the Orientation Relationships of Directionally Solidified Eutectic Ceramics by a Modified Coincidence of Reciprocal Lattice Points Model ( CRLP );Journal of the American Ceramic Society;2015-10-16

3. Direct observation of potential barrier behavior in yttrium–barium titanate observed by electrostactic force microscopy;Scripta Materialia;2007-03

4. Influence of distribution of additives on electrical potential barrier at grain boundaries in ZnO-based multilayered chip varistor;Journal of Applied Physics;2006-10-15