Ellipsometric determination of thickness and refractive index at 1.3, 1.55, and 1.7 μm for In(1−x)GaxAsyP(1−y)films on InP
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.353028
Reference28 articles.
1. Optical properties of In1−xGaxP1−yAsy, InP, GaAs, and GaP determined by ellipsometry
2. Optical properties ofIn1−xGaxAsyP1−yfrom 1.5 to 6.0 eV determined by spectroscopic ellipsometry
3. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV
4. Spectroscopic ellipsometry study of InP, GaInAs, and GaInAs/InP heterostructures
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