1. M. J. Kearney and M. J. Kelly, inHandbook on Semiconductors, series edited by T. S. Moss, volume edited by C. Hilsum (North-Holland, Amsterdam, 1993), Vol. 4, Chap. 13.
2. Real‐time thickness control of resonant‐tunneling diode growth based on reflection mass spectrometry
3. V. A. Wilkinson, M. J. Kelly and P. Kidd, to appear in Proceedings of International Conference on Semiconductor Heteroepitaxy, Montpellier, France, July, 1995.
4. Valence band engineering in strained-layer structures
5. Band-structure engineering in strained semiconductor lasers