Shaping single atomic junctions in ultra-thin Ag structures by electromigration-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Shaping single atomic junctions in ultra-thin Ag structures by electromigration

Published:2018-07-02 Issue:1 Volume:113 Page:013106
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Chatterjee A.¹²,Heidenblut T.³^ORCID,Edler F.¹^ORCID,Olsen E.¹,Stöckmann J. P.¹²,Tegenkamp C.¹²⁴,Pfnür H.¹²^ORCID

Affiliation:

1. Institut für Festkörperphysik, Leibniz Universität Hannover, Appelstraße 2, 30167 Hannover, Germany

2. Laboratorium für Nano und Quantenengineering (LNQE), Leibniz Universität Hannover, Schneiderberg 39, 30167 Hannover, Germany

3. Institut für Werkstoffkunde, Leibniz Universität Hannover, An der Universität 2, 30823 Garbsen, Germany

4. Institut für Physik, Technische Universität Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz, Germany

Funder

State of Lower Saxony, Hannover School of Nanotechnology

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5040405

Reference47 articles.

1. Current-induced marker motion in gold wires

2. Electromigration in metals

3. Electromigration: A review

4. Recent advances on electromigration in very-large-scale-integration of interconnects

5. Effect of Joule heating and current crowding on electromigration in mobile technology

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Decoding Forming Processes of Different Contact Configurations in Au- and Ag-Electrode Single-Molecule Junctions;The Journal of Physical Chemistry C;2021-12-07

2. Electromigration-induced directional steps towards the formation of single atomic Ag contacts;Beilstein Journal of Nanotechnology;2020-04-22

3. Residual stress effect governing electromigration-based free-standing metallic micro/nanowire growth behavior;Applied Physics Letters;2020-01-13

4. In-situ control of electrical properties of nanoelectromechanical resonators by electromigration for self-sustained oscillations;Applied Physics Letters;2019-11-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3