Low-frequency noise in gate overlapped lightly doped drain polycrystalline silicon thin-film transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.126602
Reference15 articles.
1. Large 1/f Noise in Polysilicon TFT Loads and its Effects on the Stability of SRAM Cells
2. Evidence of carrier number fluctuation as origin of 1/f noise in polycrystalline silicon thin film transistors
3. Noise performances in polycrystalline silicon thin-film transistors fabricated by excimer laser crystallization
4. Excess noise in polysilicon thin film transistors operated in kink regime
5. 1/fγ noise in polycrystalline silicon thin-film transistors
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Electrical Characteristic Analysis Using Low-Frequency Noise in Low-Temperature Polysilicon Thin Film Transistors;Journal of Nanoscience and Nanotechnology;2012-07-01
2. $\hbox{1}/f$ Noise Characterization of n- and p-Type Polycrystalline-Silicon Thin-Film Transistors;IEEE Transactions on Device and Materials Reliability;2009-09
3. Theory of surface noise under Coulomb correlations between carriers and surface states;Journal of Applied Physics;2002-11
4. Coulomb suppression of surface noise;Applied Physics Letters;2001-04-02
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