Electrical Characteristic Analysis Using Low-Frequency Noise in Low-Temperature Polysilicon Thin Film Transistors
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Published:2012-07-01
Issue:7
Volume:12
Page:5532-5536
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ISSN:1533-4880
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Container-title:Journal of Nanoscience and Nanotechnology
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language:en
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Short-container-title:j nanosci nanotechnol
Author:
Kim Y. M.,Jeong K. S.,Yun H. J.,Yang S. D.,Lee S. Y.,Kim M. J.,Kwon O. S.,Jeong C. W.,Kim J. Y.,Kim S. C.,Lee G. W.
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering