Optoelectronic characterization by photothermal deflection: Single‐crystalline semiconductors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.358746
Reference11 articles.
1. Photothermal deflection spectroscopy and detection
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5. Comment on G.J. Rees “surface recombination velocity—a useful concept?”
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