Analytical current–voltage model for polycrystalline-silicon thin-film transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1465108
Reference3 articles.
1. Model for the above‐threshold characteristics and threshold voltage in polycrystalline silicon transistors
2. Crystalline Properties of Laser Crystallized Silicon Films
3. Two-Dimensional Numerical Simulation of Solid-Phase-Crystallized Polysilicon Thin-Film Transistor Characteristics
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1. A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors;Materials;2018-03-11
2. Surface-Potential-Based Analytic DC $I$ –$V$ Model With Effective Electron Density for $a$-IGZO TFTs Considering the Parasitic Resistance;IEEE Electron Device Letters;2011-11
3. Capacitance Model for Thin-Film Transistors with Interface Traps;ECS Transactions;2010-10-01
4. Drain current model for thin-film transistors with interface trap states;Journal of Applied Physics;2010-02
5. Analysis of Photon-Induced Drain Current in Polycrystalline-Silicon Thin-Film Transistors;Japanese Journal of Applied Physics;2009-10-20
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