Low‐temperature ion mixing of yttrium and silicon

Author:

Alford T. L.,Bo/rgesen P.,Mayer J. W.,Lilienfeld D. A.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Structural study of YSi[sub 1.7] layers formed by channeled ion beam synthesis;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1998-07

2. Formation and kinetics of ion‐induced yttrium silicide layers;Journal of Applied Physics;1995-02

3. Silicon ion bombardment of Sb/Si contacts;Surface and Interface Analysis;1992-06

4. The dependence of low‐temperature ion mixing of Y/Si bilayers on nuclear energy deposition;Journal of Applied Physics;1991-06

5. Ion‐induced formation of stable and metastable phases in the Y‐Si system;Applied Physics Letters;1991-04-29

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