Characterization of refractive index change induced by electron irradiation in amorphous thin As2S3 films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.365952
Reference11 articles.
1. Electron-Beam-Induced Refractive-Index Change of Amorphous Semiconductors
2. Direct writing of optical gratings using a scanning electron microscope
3. Scanning-electron-microscope-written gratings in chalcogenide films for optical integrated circuits
4. Microgratings for high-efficiency guided-beam deflection fabricated by electron-beam direct-writing techniques
5. Integrated grating circuit for guided-beam multiple division fabricated by electron-beam direct writing
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films;Thin Solid Films;2008-09
2. Influence of ultraviolet-light exposure on electron-beam written gratings in amorphous As–Se thin films coated with different metals;Applied Physics Letters;2001-09-24
3. Refractive index change caused by electron irradiation in amorphous As–S and As–Se thin films coated with different metals;Journal of Applied Physics;2001-09
4. Refractive-index change caused by electrons in amorphous AsS and AsSe thin films doped with different metals by photodiffusion;Journal of the Optical Society of America B;2001-08-01
5. Electron and photon induced metal diffusion in amorphous As50Se50 thin films coated with two metal layers;Optics Communications;2001-06
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3