Low-frequency noise in a thin active layer α-Si:H thin-film transistors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.370614
Reference20 articles.
1. Transport and recombination in amorphousp‐i‐n‐type solar cells studied by electrically detected magnetic resonance
2. a-Si:H linear and 2-D image sensors
3. High-resolution, high-frame-rate, flat-panel TFT array for digital x-ray imaging
4. Measurements and comparison of low frequency noise in npn and pnp polysilicon emitter bipolar junction transistors
5. Measurements and comparison of low frequency noise in npn and pnp polysilicon emitter bipolar junction transistors
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1. The impact of active layer thickness on low-frequency noise characteristics in InZnO thin-film transistors with high mobility;Applied Physics Letters;2012-04-23
2. Theory of surface noise under Coulomb correlations between carriers and surface states;Journal of Applied Physics;2002-11
3. Coulomb suppression of surface noise;Applied Physics Letters;2001-04-02
4. Low-frequency noise in polymer transistors;IEEE Transactions on Electron Devices;2001
5. 1/f noise modeling in long channel amorphous silicon thin film transistors;Journal of Applied Physics;2000-02-15
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