Measurements and comparison of low frequency noise in npn and pnp polysilicon emitter bipolar junction transistors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.368066
Reference26 articles.
1. Impact of polysilicon emitter interfacial layer engineering on the 1/f noise of bipolar transistors
2. Low-frequency noise in polysilicon emitter bipolar transistors
3. Low frequency noise in polysilicon‐emitter bipolar junction transistors
4. Low-frequency noise sources in polysilicon emitter BJT's: influence of hot-electron-induced degradation and post-stress recovery
5. Reduction of noise in polysilicon emitter bipolar transistors
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