The 2D Debye length: An analytical study of weak charge screening in 2D semiconductors
Author:
Affiliation:
1. Department of Electrical Engineering, Columbia University, New York, New York 10027, USA
2. National Institute of Advanced Industrial Science and Technology (AIST), Research Center for Emerging Computing Technologies, Tsukuba 305-8568, Japan
Funder
National Science Foundation
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/am-pdf/10.1063/5.0032541
Reference24 articles.
1. Electronics based on two-dimensional materials
2. Electron spin relaxation due to D'yakonov-Perel' and Elliot-Yafet mechanisms in monolayerMoS2: Role of intravalley and intervalley processes
3. 2D materials and van der Waals heterostructures
4. Field-Effect Transistors Built from All Two-Dimensional Material Components
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