The 2D Debye length: An analytical study of weak charge screening in 2D semiconductors-Reference-Cited by-同舟云学术

The 2D Debye length: An analytical study of weak charge screening in 2D semiconductors

Published:2021-01-14 Issue:2 Volume:129 Page:024301
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Bechhofer Adina R.¹^ORCID,Ueda Akiko²^ORCID,Nipane Ankur¹^ORCID,Teherani James T.¹^ORCID

Affiliation:

1. Department of Electrical Engineering, Columbia University, New York, New York 10027, USA

2. National Institute of Advanced Industrial Science and Technology (AIST), Research Center for Emerging Computing Technologies, Tsukuba 305-8568, Japan

Funder

National Science Foundation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/am-pdf/10.1063/5.0032541

Reference24 articles.

1. Electronics based on two-dimensional materials

2. Electron spin relaxation due to D'yakonov-Perel' and Elliot-Yafet mechanisms in monolayerMoS2: Role of intravalley and intervalley processes

3. 2D materials and van der Waals heterostructures

4. Field-Effect Transistors Built from All Two-Dimensional Material Components

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