Quantitative analysis of lateral force microscopy experiments
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1147214
Reference25 articles.
1. Atomic-scale friction of a tungsten tip on a graphite surface
2. Combined scanning force and friction microscopy of mica
3. Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope
4. Influence of capillary condensation of water on nanotribology studied by force microscopy
5. Influence of water vapor on nanotribology studied by friction force microscopy
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