Size dependence of the work function in InAs quantum dots on GaAs(001) as studied by Kelvin force probe microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1745110
Reference12 articles.
1. Scanning tunneling microscopy and scanning tunneling spectroscopy of self-assembled InAs quantum dots
2. Imaging and probing electronic properties of self-assembled InAs quantum dots by atomic force microscopy with conductive tip
3. Imaging the Wave-Function Amplitudes in Cleaved Semiconductor Quantum Boxes
4. Surface potential measurement of self-assembled InAs dots by scanning Maxwell stress microscopy
5. Atomically resolved structure of InAs quantum dots
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