Nanosecond x-Ray diffraction from polycrystalline and amorphous materials in a pinhole camera geometry suitable for laser shock compression experiments-Reference-Cited by-同舟云学术

Nanosecond x-Ray diffraction from polycrystalline and amorphous materials in a pinhole camera geometry suitable for laser shock compression experiments

Published:2007-08 Issue:8 Volume:78 Page:083908
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Hawreliak J.,Lorenzana H. E.,Remington B. A.,Lukezic S.,Wark J. S.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2772210

Reference29 articles.

1. Shock launching in silicon studied with use of pulsed x-ray diffraction

2. Subnanosecond x-ray diffraction from laser-shocked crystals

3. Anomalous Elastic Response of Silicon to Uniaxial Shock Compression on Nanosecond Time Scales

4. Direct Observation of theα−εTransition in Shock-Compressed Iron via Nanosecond X-Ray Diffraction

5. Universal Features of Quantized Thermal Conductance of Carbon Nanotubes

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