Rocking curve peak shift in thin semiconductor layers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.343482
Reference11 articles.
1. Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs
2. Kinematical x‐ray diffraction in nonuniform crystalline films: Strain and damage distributions in ion‐implanted garnets
3. Dynamical x‐ray diffraction from nonuniform crystalline films: Application to x‐ray rocking curve analysis
4. Nondestructive Characterization Of MOCVD-Grown GaInAs/GaAs Using Rocking Curve And Topography
5. Composition and lattice‐mismatch measurement of thin semiconductor layers by x‐ray diffraction
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