Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes-Reference-Cited by-同舟云学术

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Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes

Published:2021-04-01 Issue:4 Volume:92 Page:043703
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Kirpal Dominik¹^ORCID,Qiu Jinglan¹²^ORCID,Pürckhauer Korbinian¹^ORCID,Weymouth Alfred J.¹^ORCID,Metz Michael¹^ORCID,Giessibl Franz J.¹^ORCID

Affiliation:

1. Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany

2. College of Physics and Hebei Key Laboratory of Photophysics Research and Application, Hebei Normal University, Shijiazhuang, Hebei 050024, China

Funder

Deutsche Forschungsgemeinschaft

Publisher

AIP Publishing

Subject

Instrumentation

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0041369

Reference36 articles.

1. Atomic Force Microscope

2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

3. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

4. Atomic force microscopy as a tool for atom manipulation

5. Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Stiffness calibration of qPlus sensors at low temperature through thermal noise measurements;Beilstein Journal of Nanotechnology;2024-05-23

2. A Next-Generation qPlus-Sensor-Based AFM Setup: Resolving Archaeal S-Layer Protein Structures in Air and Liquid;The Journal of Physical Chemistry B;2023-08-01

3. Fundamental and higher eigenmodes of qPlus sensors with a long probe for vertical-lateral bimodal atomic force microscopy;Nanoscale Advances;2023

4. A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy;Beilstein Journal of Nanotechnology;2022-10-11

5. Measuring sliding friction at the atomic scale;Japanese Journal of Applied Physics;2022-06-14

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