Ex situ metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source
Author:
Affiliation:
1. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
2. Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
Funder
U.S. Department of Energy
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5057441
Reference33 articles.
1. Requirements on hard x-ray grazing incidence optics for European XFEL: analysis and simulation of wavefront transformations
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4. Recent Developments in UV Optics for Ultra-Short, Ultra-Intense Coherent Light Sources
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