Analysis of low-frequency noise in boron-doped polycrystalline silicon–germanium resistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1511815
Reference11 articles.
1. Low frequency noise in heavily doped polysilicon thin film resistors
2. Low-frequency noise of integrated polysilicon resistors
3. 1/fnoise in polycrystalline silicon resistors
4. An analytical model for 1/f noise in polycrystalline silicon thin films
5. Doping dependence of low-frequency noise in polycrystalline SiGe film resistors
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