Monte Carlo modeling of surface excitation in reflection electron energy loss spectroscopy spectrum for rough surfaces
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4739491
Reference33 articles.
1. Surface analysis and angular distributions in x-ray photoelectron spectroscopy
2. Elastic electron backscattering from silicon surfaces: effect of surface roughness
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5. Effect of surface roughness on EPES and AREPES measurements: Flat and crenels silicon surfaces
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