Cylindrically symmetric rotating crystals observed in crystallization process of InSiO film

Author:

Da Bo1,Cheng Long2ORCID,Liu Xun12,Shigeto Kunji3,Tsukagoshi Kazuhito4,Nabatame Toshihide4,Ding Zejun2,Sun Yang5,Hu Jin6,Liu Jiangwei7,Tang Daiming4ORCID,Zhang Han1,Gao Zhaoshun8,Guo Hongxuan9,Yoshikawa Hideki1,Tanuma Shigeo10

Affiliation:

1. Center for Basic Research on Materials, National Institute for Materials Science, Tsukuba, Japan

2. Department of Physics, University of Science and Technology of China, Hefei, China

3. Electron Microscope Systems Design Department, Hitachi High-Tech Corporation, Hitachinaka, Japan

4. Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, Tsukuba, Japan

5. Department of Physics, Xiamen University, Xiamen, China

6. Department of Physics and Institute for Nanoscience and Engineering, University of Arkansas, Fayetteville, AR, USA

7. Research Center for Electronic and Optical Materials, National Institute for Materials Science, Tsukuba, Japan

8. Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, P.R. China

9. Key Laboratory of MEMS of Ministry of Education, School of Electronic Science and Engineering, Southeast University, Nanjing, People’s Republic of China

10. Research Network and Facility Services Division, National Institute for Materials Science, Tsukuba, Japan

Funder

Basic Energy Sciences

Education Ministry through “111 Project 2.0”

National Key Research and Development Project of Hainan Province

Publisher

Informa UK Limited

Subject

General Medicine

Reference89 articles.

1. Scanning electron microscopy 1928-1965

2. A Monte Carlo modeling of electron interaction with solids including cascade secondary electron production

3. Surface sensitivity of secondary electrons emitted from amorphous solids: Calculation of mean escape depth by a Monte Carlo method

4. Adams WIL, Plump CH. Half-tone photo-engraving. The photographic times. Waterbury: Scoville Manufacturing Co.; 1894.

5. A scanning electron microscope;Zworykin VA;ASTM Bull,1942

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3