Charging phenomena in low‐voltage electron microscopy of laser‐fractured fluoride surfaces
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.363463
Reference14 articles.
1. Laser sputtering
2. Interactions of wide band‐gap single crystals with 248 nm excimer laser radiation. I. MgO
3. Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization technique
4. Laser-stimulated desorption and damage at polished CaF2 surfaces irradiated with 532 nm laser light
5. Sem-analysis of fracture features formed in excimer-laser induced surface damage of CaF2
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2. Microstructural characterization of SOFC Ni–YSZ anode composites by low-voltage scanning electron microscopy;Solid State Ionics;2008-03-15
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