Micrograph contrast in low-voltage SEM and cryo-SEM

Author:

Liberman Lucy,Kleinerman Olga,Davidovich Irina,Talmon Yeshayahu

Funder

United States-Israel Binational Science Foundation

Russell Berrie Nanotechnology Institute

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. A model for calculating secondary and backscattered electron yields;Joy;J. Microsc.,1987

2. Microscopy and X-Ray Microanalysis;Goldstein,2018

3. The scanning electron microscope and its fields of application;Smith;Br. J. Appl. Phys.,1955

4. Secondary electron emission;Dekker;Solid State Phys.,1958

5. Secondary electron yield with primary electron beam of kilo‐electron‐volts;Shimizu;J. Appl. Phys.,1974

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