A Secondary Emission Analog for Improved Auger Spectroscopy with Retarding Potential Analyzers
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1685310
Reference16 articles.
1. Secondary Electron Emission from Solids
2. HIGH SENSITIVITY AUGER ELECTRON SPECTROMETER
3. Analysis of Materials by Electron‐Excited Auger Electrons
4. Estimates of the Efficiencies of Production and Detection of Electron‐Excited Auger Emission
5. Resolution and Sensitivity Considerations of an Auger Electron Spectrometer Based on Display LEED Optics
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