Effect of surface excitations on the reflection electron energy loss spectrum in silicon-Reference-Cited by-同舟云学术

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Effect of surface excitations on the reflection electron energy loss spectrum in silicon

Published:2007-06 Issue:3 Volume:1 Page:323-327
ISSN:1027-4510
Container-title:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Parshin A. S.,Aleksandrova G. A.,Zyuganova A. V.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451007030172.pdf

Reference22 articles.

1. H. Raether, Springer Tracts in Modern Physics 88, 195 (1980).

2. V. G. Lifshits and Yu. V. Lunyakov, EELS Spectra of Surface Phases on Silicium (Dalnauka, Vladivosiok, 2004).

3. E. Yu. Flegontova, L. A. Bakaleinikov, K. Yu. Pogrebitskii, et al., Zh. Tekh. Fiz. 70(12), 6 (2000) [Tech. Phys. 45, 1518 (2000)].

4. L. A. Bakaleinikov, E. Yu. Flegontova, and K. Yu. Pogrebitskii, Zh. Tekh. Fiz. 71(7), 14 (2001) [Tech. Phys. 46, 796 (2001)].

5. S. Tougaard and I. Chorkendorff, Phys. Rev. B 35(13), 6570 (1987).

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