Range of validity of the surface‐photovoltage diffusion length measurement: A computer simulation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.341843
Reference11 articles.
1. Minority‐carrier diffusion lengths in amorphous silicon‐based alloys
2. Differential surface photovoltage measurement of minority‐carrier diffusion length in thin films
3. Assessment of the surface‐photovoltage diffusion‐length measurement
4. A Method for the Measurement of Short Minority Carrier Diffusion Lengths in Semiconductors
5. Theory and experiment on the surface‐photovoltage diffusion‐length measurement as applied to amorphous silicon
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