Enhanced bolometric properties of TiO2−x thin films by thermal annealing
Author:
Affiliation:
1. Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, 335 Gwahangno, Yuseong-gu, Daejeon 305-701, South Korea
2. Department of Physics, Sri Venkateswara University, Tirupati-517502, India
Funder
Brain Korea 21 plus program
Chungcheong Institute for Regional Program Evaluation
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4926604
Reference25 articles.
1. Infrared detectors: an overview
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