Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy-Reference-Cited by-同舟云学术

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Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

Published:2007-10-22 Issue:17 Volume:91 Page:173120
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Li Bassi A.,Casari C. S.,Cattaneo D.,Donati F.,Foglio S.,Passoni M.,Bottani C. E.,Biagioni P.,Brambilla A.,Finazzi M.,Ciccacci F.,Duò L.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2800810

Reference20 articles.

1. The art and science and other aspects of making sharp tips

2. Enhanced atomic-scale contrast on Fe3O4 (100) observed with an Fe STM tip

3. Electrochemically etched nickel tips for spin polarized scanning tunneling microscopy

4. Electrochemical preparation of cobalt tips for scanning tunneling microscopy

5. Spin-Polarized Vacuum Tunneling into the Exchange-Split Surface State of Gd(0001)

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